Author: Velthaus, V.
Paper Title Page
TU1C2
Surface Treatment Procedures to Mitigate Ion-Induced Desorption in Heavy Ion Accelerators  
 
  • V. Velthaus, M. Bender, C. Trautmann
    GSI, Darmstadt, Germany
 
  Ion-induced desorption is a serious limitation for stable operation of high beam intensities in heavy ion synchrotrons. Next generation heavy ion accelerators like FAIR or SPIRAL2 are designed for intensities that are orders of magnitude higher than the intensity of existing machines. Hence, ion-induced desorption becomes a big challenge. To better understand and control the influence of material and surface factors, desorption measurements with swift heavy ions (Ca and Au at 4.8 MeV/u) were conducted with focus on oxygen-free copper and tungsten samples. The surfaces were treated by different combinations of milling, lapping, polishing, etching and sputtering. Some of the samples were coated by carbon, titanium nitride or TiZrV. For all tested samples desorption yields (number of released molecules per impacting ion) for H2, H2O, CO, CO2, O2 and Ar will be presented. For copper, surface cleaning by sputtering with 5 keV argon ions reduces the desorption yield significantly. Another promising method to reduce ion-induced desorption is thermal annealing at 400 °C for about 4 h under ultra-high vacuum conditions. Suitable annealing and cleaning parameters will be presented.  
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